All Facilities
Instruments found: 44
SEM FEI
Scanning Electron Microscope with field emission source, equipped with SE, BSE and Environmental (GSED) detectors, EDS system (Oxford Inca Energy System 250), heating stage (FEI) and tensile/compression test module (Gatan MST200).
SEM ZEISS GEMINI
FEG-SEM with a nominal resolution of 1.2 nm, equipped with an integrated EDS/WDS micro-analytical system and with an EBSD detector for the crystallographic analysis of the sample surface
SEM ZEISS SIGMA
Scanning electron microscope with field-emission source, equipped with detectoirs for EDS, backscattered and secondary electrons
SEM-AFM with Optical Profiler
SEM system with EDS-SPM, Correlative AFM during SEM. The instrument has conventional tungsten filament, equipped with modern electron optics based on a unique four-lens Wide Field OpticsTM column. The SEM is equipped with four types of detectors (EDS, BSE, SE).
SOURIRE
The SOURIRE Lab is a fast (14 MeV) neutron irradiation plant for material testing, neutron activation analysis and calibration of new detectors. The neutron source is a Deuterium-Tritium (D-T) type, and the total flux is 10 10 neutron per second over the entire solid angle.
Spectrofluorimeter
The spectrometer Eclipse, Varian, is a fluorimeter for the measurement of excitation and emission spectra of fluorophores in solutions.
TEM FEI
Transmission Electron Microscope with LaB6 source (120 kV) and BF detector and FEI Eagle 4k CCD camera (bottom mounted).
TEM High Resolution
The TEM instrument - ThermoFisher Talos F200X - combines outstanding high-resolution S/TEM and TEM imaging with high performance energy dispersive x-ray spectroscopy (EDS) signal detection and 3D chemical characterization with compositional mapping.
TEM JEOL
Transmission Electron Microscope (TEM) with LaB6 emitter, 80-200 kV accelerating voltage, point-to-point resolution of 0.24 nm, EDS micro-analysis, 9 Mpx CMOS camera.
TESCAN UniTOM HR
TESCAN UniTOM HR is a micro-CT system enabling multi-scale X-Ray Imaging with spatial resolution ranging from tens of microns down to the sub-micron level (around 600 nm), supports continuous 360° rotation and in situ experiments and it is designed for dynamic studies. Applications extend to archaeology and cultural heritage, where the system provides insights into the…
Instruments found: 44
SEM FEI
Scanning Electron Microscope with field emission source, equipped with SE, BSE and Environmental (GSED) detectors, EDS system (Oxford Inca Energy System 250), heating stage (FEI) and tensile/compression test module (Gatan MST200).
SEM ZEISS GEMINI
FEG-SEM with a nominal resolution of 1.2 nm, equipped with an integrated EDS/WDS micro-analytical system and with an EBSD detector for the crystallographic analysis of the sample surface
SEM ZEISS SIGMA
Scanning electron microscope with field-emission source, equipped with detectoirs for EDS, backscattered and secondary electrons
SEM-AFM with Optical Profiler
SEM system with EDS-SPM, Correlative AFM during SEM. The instrument has conventional tungsten filament, equipped with modern electron optics based on a unique four-lens Wide Field OpticsTM column. The SEM is equipped with four types of detectors (EDS, BSE, SE).
SOURIRE
The SOURIRE Lab is a fast (14 MeV) neutron irradiation plant for material testing, neutron activation analysis and calibration of new detectors. The neutron source is a Deuterium-Tritium (D-T) type, and the total flux is 10 10 neutron per second over the entire solid angle.
Spectrofluorimeter
The spectrometer Eclipse, Varian, is a fluorimeter for the measurement of excitation and emission spectra of fluorophores in solutions.
TEM FEI
Transmission Electron Microscope with LaB6 source (120 kV) and BF detector and FEI Eagle 4k CCD camera (bottom mounted).
TEM High Resolution
The TEM instrument - ThermoFisher Talos F200X - combines outstanding high-resolution S/TEM and TEM imaging with high performance energy dispersive x-ray spectroscopy (EDS) signal detection and 3D chemical characterization with compositional mapping.
TEM JEOL
Transmission Electron Microscope (TEM) with LaB6 emitter, 80-200 kV accelerating voltage, point-to-point resolution of 0.24 nm, EDS micro-analysis, 9 Mpx CMOS camera.
TESCAN UniTOM HR
TESCAN UniTOM HR is a micro-CT system enabling multi-scale X-Ray Imaging with spatial resolution ranging from tens of microns down to the sub-micron level (around 600 nm), supports continuous 360° rotation and in situ experiments and it is designed for dynamic studies. Applications extend to archaeology and cultural heritage, where the system provides insights into the…