All Facilities

Scanning Electron Microscope with field emission source, equipped with SE, BSE and Environmental (GSED) detectors, EDS system (Oxford Inca Energy System 250), heating stage (FEI) and tensile/compression test module (Gatan MST200).

FEG-SEM with a nominal resolution of 1.2 nm, equipped with an integrated EDS/WDS micro-analytical system and with an EBSD detector for the crystallographic analysis of the sample surface

Scanning electron microscope with field-emission source, equipped with detectoirs for EDS, backscattered and secondary electrons

SEM system with EDS-SPM, Correlative AFM during SEM. The instrument has conventional tungsten filament, equipped with modern electron optics based on a unique four-lens Wide Field OpticsTM column. The SEM is equipped with four types of detectors (EDS, BSE, SE).

The SOURIRE Lab is a fast (14 MeV) neutron irradiation plant for material testing, neutron activation analysis and calibration of new detectors. The neutron source is a Deuterium-Tritium (D-T) type, and the total flux is 10 10 neutron per second over the entire solid angle.

The spectrometer Eclipse, Varian, is a fluorimeter for the measurement of excitation and emission spectra of fluorophores in solutions.

Transmission Electron Microscope with LaB6 source (120 kV) and BF detector and FEI Eagle 4k CCD camera (bottom mounted).

Transmission Electron Microscope (TEM) with LaB6 emitter, 80-200 kV accelerating voltage, point-to-point resolution of 0.24 nm, EDS micro-analysis, 9 Mpx CMOS camera.