Zeiss Gemini 500

General information

Category

Microscopy

Key instrumentation
Scanning Probe Microscopes

Accelerating voltage between 1 kV to 30 kV, nominal resolution of 1.2 nm.

Accelerating voltage between 1 kV to 30 kV, nominal resolution of 1.2 nm. In addition to the common “in-camera” BSE and SE detectors, the instrument is equipped with “in-lens” detectors (BSE/SE) for high-resolution imaging and with a STEM detector. The FEG-SEM is also equipped with a Bruker integrated EDS/WDS micro-analytical system, specially designed for light elements. Finally, the FEG-SEM is equipped with an EBSD detector (Bruker) for the crystallographic analysis of the sample surface. The EBSD comes with the Argus FSE and BSE detector for the acquisition of orientational contrast images.

Technical description
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Research areas and applications

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Science highlights

Experimental team

Instrument Scientist
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STAFF
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