AFM PARK

The Park NX10 AFM is a high-resolution scanning probe microscopy system designed for nanoscale surface characterization of materials, thin films, nanostructures, and functional interfaces. The system belongs to the Park Systems AFM family, known for high-precision metrological performance, low noise, and true non-contact imaging capabilities, widely used in materials science and nanotechnology laboratories.
In particular, this instrument built around improved XY and Z separated scanner performance. This includes fast Z-servo speed, which gives quick vertical response, and improved Z scan straightness for accurate imaging. In addition, the XY scanner ensures precise positioning during scans. Another highlight is the low Z detector noise. Thanks to the stacked piezo actuator and strain gauge sensor, the NX provides both high precision and low noise levels from extremely flat to rough samples. The NX head integrates a superluminescent diode that provides low coherence illumination, minimizing interference for stable signal detection. The laser beam is guided through precision mirrors to the cantilever and position-sensitive photodetector (PSPD), ensuring accurate signal alignment.
The system is equipped with silicon or silicon-nitride cantilevers featuring calibrated spring constants and interchangeable probes optimized for multiple measurement modes. Functionalized tips are available for specialized electrical and nanomechanical characterization. Cantilever deflection is monitored an optical lever detection system capable of measuring both vertical displacement and torsional motion. Sample scanning and positioning are performed by a closed-loop piezoelectric.