All Facilities
FIB SEM XB340
FIB-SEM systems offer high-resolution imaging and characterization of the sample surface. The focused Ga+ beam is a versatile tool for precise milling of the bulk sample, allowing exposure of sub-surface details or fabrication of site-specific TEM specimens. The FIB-SEM is also used for nanofabrication as the pattern generator and injection system for precursors allows the fabrication of complex structures through beam-induced deposition or lithographic process.
TESCAN UniTOM HR
TESCAN UniTOM HR is a micro-CT system enabling multi-scale X-Ray Imaging with spatial resolution ranging from tens of microns down to the sub-micron level (around 600 nm), supports
continuous 360° rotation and in situ experiments and it is designed for dynamic studies. Applications extend to archaeology and cultural heritage, where the system provides insights into the internal composition of artifacts and ancient objects without damage.