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AFM

General information

UNIT
University of Milano Bicocca

Category

Microscopy

Key instrumentation
AFM Nanowizard II - JPK-Bruker

The Nanowizard® 4XP – JPK-Bruker atomic force microscope combines atomic resolution and fast scanning with rates of up to 150 lines/sec and a large scan range of 100µm in one system. It is designed to provide the highest mechanical and thermal stability on inverted optical microscopes during long-term experiments on samples ranging from single molecules to living cells and tissues. It allows Structural analysis and nanomechanical characterization of biological samples. Precise investigation of molecular mechanisms, biochemical interactions, and cell mechanics. It is equipped with the JPK CellMech Package for microrheology measurements

Medium-Range Facilities
International Medium-Range Facilities
Technical description
The AFM Nanowizard II - JPK-Bruker is optimal for soft material (live cells, cell membranes, biomaterials) investigations as well as force spectroscopy studies (ligand binding, protein unfolding and cell adhesion). It allows high-resolution images and force measurements both in air and fluid environment. The NanoWizard II is coupled with a Zeiss inverted microscope with Colibrì lamp source for wide spectral fluorescence excitation (365 nm, 470 nm, 590 nm). and it can allow for DirectOverlay™ of AFM and optics images. It has a large scan field (100x100 µm^2) and a 15 µm Z scan range with highest closed loop performance through capacitive sensors. It allow for Patented DirectOverlay™ software feature for combining AFM and optical images distortion free.
Research areas and applications

Characterization of morphology of single filament of DNA and single cells, nanomechanics of single cells and biological materials, single molecule protein unfolding.

Science highlights

Experimental team

Instrument Scientist
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STAFF
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