Scanning Electron Microscope with field emission source, equipped with SE, BSE and Environmental (GSED) detectors, EDS system (Oxford Inca Energy System 250), heating stage (FEI) and tensile/compression test module (Gatan MST200).
SEM FEI
General information
Field Emission Scanning electron microscopy QUANTA 200 with Energy Dispersive X-ray analysis
Technical description
Scanning Electron Microscope FEI QUANTA 200 with field emission source, equipped with SE, BSE and Environmental (GSED) detectors, EDS system (Oxford Inca Energy System 250), heating stage (FEI) and tensile/compression test module (Gatan MST200).
Research areas and applications
material science, composites, nanocomposites, biomaterials, morphological analysis, elemental analysis, element mapping
