SEM FEI

Field Emission Scanning electron microscopy QUANTA 200 equipped with: - Peltier Stage - Peltier heating Stage Control Kit (1000°C) - Energy Dispersive X-Ray Spectrometer (EDS) Oxford Inca Energy System 250 equipped with INCAx-act LN2-free Analytical Silicon Drift Detector with PentaFET® Precision Detectors: - Secondary electron detector (SED) Everhardt-Thornley - Large field detector (LFD) - Gaseous SED (GSED) - Backscattered electron detectors (BSED) for HV and observations - Solid state STEM detector

Thanks to its versatility and its accessories, the SEM FEI is very useful for the characterization in high vacuum, low vacuum and extended low vacuum (ESEM) conditions of inorganic, organic and biological materials through morphological analysis using different detectors and elemental analysis and mapping. The accessory for in-SEM mechanical analysis of samples is also available.