SEM FEI

Scanning Electron Microscope FEI QUANTA 200 with field emission source, equipped with SE, BSE and Environmental (GSED) detectors, EDS system (Oxford Inca Energy System 250), heating stage (FEI) and tensile/compression test module (Gatan MST200).

Thanks to its versatility and its accessories, the SEM FEI is very useful for the characterization in high vacuum, low vacuum and extended low vacuum (ESEM) conditions of inorganic, organic and biological materials through morphological analysis using different detectors and elemental analysis and mapping. The accessory for in-SEM mechanical analysis of samples is also available.