SEM ZEISS GEMINI

The ZEISS Gemini SEM at the University of Milano‑Bicocca unit is a high‑performance field‑emission scanning electron microscope designed for advanced morphological, compositional, and crystallographic analysis of a wide range of materials. With a nominal resolution of 1.2 nm, the system enables high‑definition imaging of surface features, microstructures, and nanoscale details, making it suitable for research in materials science, nanotechnology, geology, and life sciences. The microscope integrates a complete micro‑analytical suite combining energy‑dispersive (EDS) and wavelength‑dispersive (WDS) X‑ray spectroscopy, allowing precise elemental identification, quantitative analysis, and high‑resolution chemical mapping. This dual‑detector configuration enhances sensitivity across the periodic table and supports the investigation of complex, multi‑phase systems. An EBSD detector is incorporated for crystallographic characterization of sample surfaces, enabling the determination of grain orientation, phase distribution, texture, and strain fields. This capability is essential for studies involving deformation mechanisms, thin‑film microstructure, and the correlation between crystallography and material properties. The Gemini electron‑optical column ensures stable beam performance at low accelerating voltages, facilitating high‑contrast imaging of beam‑sensitive or low‑Z materials. Automated stage control, advanced imaging software, and flexible detection modes support efficient workflows and multi‑modal data acquisition. Overall, the ZEISS Gemini SEM provides a powerful and versatile platform for researchers and industrial users requiring high‑resolution imaging, robust micro‑analysis, and detailed crystallographic insight.