SEM ZEISS SIGMA

General Information

Technique

Microscopy, Spectroscopy

Key Instrumentation

SEM with field-emission source

The SEM ZEISS Sigma at the CSGI – University of Florence unit is a high‑performance field‑emission scanning electron microscope designed for advanced morphological, compositional, and microstructural analysis of a wide range of materials. Its field‑emission source ensures a highly stable, bright electron beam, enabling high‑resolution imaging at both high and low accelerating voltages, which is essential for the investigation of nanostructured, beam‑sensitive, or low‑Z materials.
The system is equipped with multiple electron detectors, including secondary‑electron (SE) and backscattered‑electron (BSE) detectors, allowing detailed characterization of surface topography, compositional contrast, and crystallographic features. An integrated EDS detector provides elemental identification and quantitative microanalysis, supporting high‑resolution chemical mapping and enabling correlation between morphology and composition. The microscope’s variable‑pressure capabilities allow the examination of non‑conductive or environmentally sensitive samples without the need for conductive coatings, expanding its applicability to polymers, biological tissues, gels, and hydrated materials. The Gemini electron‑optical column ensures excellent imaging performance at low kV, delivering enhanced contrast and minimized charging effects. Automated stage control and intuitive imaging software support precise navigation, multi‑area acquisition, and efficient workflow management.
The system’s versatility makes it suitable for applications in materials science, nanotechnology, geology, cultural‑heritage studies, and life sciences. Overall, the ZEISS Sigma SEM provides a robust and flexible platform for researchers and industrial users requiring high‑resolution imaging, reliable microanalysis, and comprehensive characterization of complex materials.

Experimental team

Instrument Scientist
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