AFM Raman with Optical Profiler

General Information

Technique

Microscopy

Key Instrumentation

Tip-Enhanced Raman& PL spectroscopy Horiba - TERS/TEPL

The Atomic Force Microscope‑Raman platform at the NAST Centre, University of Rome Tor Vergata, integrates a fully automated XploRA Plus micro‑Raman spectrometer with an advanced atomic force microscope to enable combined Raman‑AFM and TERS (Tip-Enhanced Raman Spectroscopy) analyses on a wide range of materials and devices. The system supports confocal Raman, fluorescence and photoluminescence imaging, allowing users to acquire chemical, structural and optical information with diffraction‑limited resolution. Through external manipulators and specialized probes, it provides flexible access to micro and nanoscale regions of interest, enabling correlative studies that link vibrational signatures with topographical, mechanical and electrical properties. The Atomic Force Microscope module operates in multiple modes, including contact, tapping, phase imaging and force spectroscopy, making it suitable for polymers, nanostructures, thin films, 2D materials and biological samples. Complementing the AFM‑Raman unit, the ZETA Instruments Z20 Optical Profiler offers non‑contact 3D surface metrology and high‑resolution imaging of any type of surface or light‑emitting structure. Its ability to simultaneously collect quantitative 3D data and true‑colour infinite‑focus images provides a valuable bridge between microscale optical inspection and nanoscale AFM‑Raman characterization. Together, these instruments form a versatile, multi‑modal platform that supports advanced research in materials science, nanotechnology, micro‑ and nano‑fabrication, photonics and bio‑interfaces, offering academic and industrial users a powerful toolset for comprehensive, multi‑scale analysis.

Experimental team

Instrument Scientist
  • Mattia Gaboardi
  • NAST Centre - University of Rome Tor Vergata
  • Researcher
+
Staff
+
+