AFM Raman with Optical Profiler

The RAMAN Microscope includes 3 internal lasers (532, 638, and 785 nm) combined with 12 density filter levels and 4 gratings (600, 1200, 1800, and 2400 g/mm) to cover all the UV-Vis range with maximum resolution. The wavelength range covers from 75 up to 4000 cm-1. Experiments can be run either in the microscopy configuration or the AFM configuration, with the laser being directed toward two distinct sample positions. The ancillary optical profilometer is characterized by an XY stage of dimensions 100x100 mm, with standard motion along the Z direction, magnifications between 5x and 100x, with fields of view between 20mm and 1mm, respectively. The profilometer features a multi-mode CCD camera (5MPixels).

Nanostructured materials characterization; spatial characterizations; 3D Raman imaging; polymers; pharmaceuticals; gem investigation and mineral phases. Characterization of composite materials, solar cells, LAB on Chip, MEMS e MicroFluidica, robotics and microelectronics (3D metrology and in semiconductors).