AFM Raman with Optical Profiler

General information

Category

Microscopy

Key instrumentation
Tip-Enhanced Raman& PL spectroscopy Horiba - TERS/TEPL

The Raman Spectrometer XploRA Plus is a compact and fully automated micro-spectrometer using vibrational Raman spectroscopy and an AFM for combined Raman-AFM and TERS. The operation modes combine confocal Raman, fluorescence, and photoluminescence imaging and spectroscopy through external manipulators and probes. The optical profiling microscope (Z20 by ZETA Instruments) is an ancillary equipment that can be used for optical profiling of any type of surface and light signal. It provides 3D metrology and imaging capability in a compact, robust package, which simultaneously collects high-resolution 3D data and a True Color infinite focus image.

Technical description
The RAMAN Microscope includes 3 internal lasers (532, 638 and 785 nm) combined with 12 density filters levels and 4 gratings (600, 1200, 1800 and 2400 g/mm) to cover all the UV-Vis range with maximum resolution. The wavelength range covers from 75 up to 4000 cm-1.
Research areas and applications

Nanostructured materials characterization; spatial characterizations; 3D Raman imaging; polymers; pharmaceuticals; gem investigation and mineral phases. Characterization of composite materials, solar cells, LAB on Chip, MEMS e MicroFluidica, robotics and microelectronics (3D metrology and in semiconductors).

Science highlights

Experimental team

Instrument Scientist
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STAFF
  • Laura Fazi
  • NAST Centre - University of Rome Tor Vergata
  • PostDoc
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