SAXS WAXD
General information
UNIT
CNR-IPCB
Category
Photons
Key instrumentation Electron Microscope / Scanning Probe Microscope / X-Ray microanalysis
Saxspace Anton-Paar. Small and Wide Angle X-ray Diffractometer. X-ray scattering in the angular range of 0 – 10° detected by CCD or imaging plate, and up to 60° detected by using an imaging plate for the systems coupling SAXS and Wide Angle X-Ray Scattering, WAXS.
Technical description
The investigated sample is irradiated with a monochromatic radiation, and scattered X-rays are typically collected in an angular range of 0 – 10° by a suitables (ie. CCD or imaging plate) and up to 60° (by using an imaging plate for the systems coupling SAXS and Wide Angle X-Ray Scattering, WAXS). Samples can be measured under various conditions, like at different temperature, humidity, high pressure and under mechanical stress/strain conditions. Special features: - TrueFocus: self-alignment with X-ray beam; - TrueSWAXS: simultaneous SWAXS studies up to 60° 2Ѳ; - StageMaster: YZ stage with auto-recognition of sample stages. Accessible q range 0.03 nm-1 to 40.7 nm-1, 200 nm > d > 0.15 nm. System resolution qmin: 0.03 nm-1.
Research areas and applications
The SAXS WAXD facility is very useful for the structural characterization, including analysis of crystal structures, phase domains, phase-segregation studies, organization, and orientation of nanomaterials for inorganic and organic materials.
