The SUPRA 35 Field Emission SEM provides improved image resolution and a high productivity and versatility.
SEM LEO SUPRA
General information
Category
Microscopy
Key instrumentation SUPRA 35, Field Emission Scanning Electron Microscope- ZEISS
The SUPRA 35 Field Emission SEM provides improved image resolution and a high productivity and versatility.
Technical description
The FE-SEM electron gun is a Schottky Field Emission Gun and it is endowed with several detectors: Back Scattering Detector, Everhart Thornley and In-lens Secondary Electron Detector and an Energy Dispersive Spectrometer (EDS) from Oxford Instruments INCA 200. The ability to detect BSE leads to the obtaining of sub-surface information and nano-scale composition.
Research areas and applications
Materials characterization: solid-state or biological specimens, conductive and non-conductive.
Science highligths
Experimental team
Instrument Scientist
- Giovanni Romanelli
- NAST Centre - University of Rome Tor Vergata
- Researcher
STAFF
- Laura Fazi
- NAST Centre - University of Rome Tor Vergata
- PostDoc
- Anna Prioriello
- NAST Centre - University of Rome Tor Vergata
- PostDoc