X-Ray Diffractometer
General Information
The Rigaku SmartLab SE X‑ray diffractometer at the University of Milano‑Bicocca unit is a highly versatile, research‑grade platform designed for advanced structural characterization of crystalline powders, thin films, and complex materials. Equipped with fully automated alignment and component‑recognition capabilities, the system ensures optimal optical configuration and reproducible measurement conditions, significantly reducing setup time and maximizing instrument uptime. Its cross‑beam optics allow rapid switching between Bragg–Brentano and parallel‑beam geometries, enabling high‑quality data collection for both powder diffraction and thin‑film analysis. The instrument supports non‑ambient experiments through a dedicated chamber that enables measurements under inert atmospheres up to 1 bar or under vacuum, with temperature control from 220 K to 500 K. This capability is essential for studying phase transitions, thermal expansion, structural stability, and reaction pathways in situ. The SmartLab SE can also accommodate a wide range of sample stages and accessories, including low‑ and high‑temperature stages, automated sample changers, and specialized holders for films, wafers, and capillaries. Its advanced detection system, featuring hybrid pixel array detectors with high angular resolution and dynamic range, ensures accurate peak profiling, rapid data acquisition, and excellent sensitivity for weakly scattering materials. The integrated SmartLab Studio II software provides guided workflows, automated optimization of measurement parameters, and comprehensive tools for phase identification, Rietveld refinement, stress analysis, texture evaluation, and reflectometry. Overall, the SmartLab SE offers a powerful and flexible solution for researchers and industrial users requiring precise, high‑quality diffraction data across a broad range of materials and experimental conditions.
Technical description
The Rigaku SmartLab SE diffractometer at the University of Milano‑Bicocca unit is a fully automated, research‑grade X‑ray diffraction platform designed for advanced structural analysis of crystalline powders, thin films, and complex materials. Its architecture is built around the SmartLab Studio II software environment, an integrated modular platform that guides users through instrument configuration, data acquisition, and analysis with intelligent, context‑aware workflows. The system features a cross‑beam optics module that enables seamless switching between Bragg–Brentano and parallel‑beam geometries without manual realignment, ensuring optimal performance for both powder diffraction and thin‑film measurements. Detection flexibility is provided by the HyPix‑400 2D hybrid pixel detector, which supports 0D, 1D, and 2D acquisition modes, allowing rapid, high‑resolution data collection across a wide range of applications. For high‑speed powder diffraction, the D/teX Ultra 250 1D detector accelerates measurements by a factor of 250 while offering adjustable energy resolution of approximately 20% or 4%, depending on sample requirements. The instrument incorporates fully automated alignment routines, including optics and sample positioning, driven by the integrated Guidance software, which ensures reproducible measurement conditions and minimizes operator intervention. Self‑aligned optics further enhance system stability, maximize uptime, and reduce maintenance costs.
Research areas and applications
Thin Films, Materials Science, Engineering
Science highlights
Experimental team
- Angiolina Comotti
- University of Milano Bicocca
- Professor of Industrial Chemistry
