SEM system with EDS-SPM, Correlative AFM during SEM. The instrument has conventional tungsten filament, equipped with modern electron optics based on a unique four-lens Wide Field OpticsTM column. The SEM is equipped with four types of detectors (EDS, BSE, SE, water vapour detector).
SEM with correlative AFM
Research areas and applications
Fundamental Materials Research, Quality control and failure analysis, Technical Cleanliness, Forensics, Catalysis Research, Materials Testing (energy storage, automotive, etc). Characterization of composite materials and interfaces in medicine, cultural heritage, prosthetics, robotics and microelectronics. Topography and spectroscopic characterization of surfaces and interfaces of polymers, semiconductors, composite materials, with application also in cultural heritage.