SAXS GISAXS

General Information

Technique

Diffraction

Key Instrumentation

SAXS, USAXS and GISAXS

The SAXS/GISAXS facility at the CSGI – University of Florence unit is based on a Xenocs XEUSS 3.0 system designed for high‑precision structural characterization of materials at the nanoscale.
The instrument operates in SAXS, USAXS, and GISAXS modes, enabling the investigation of bulk samples, thin films, nanostructured surfaces, and soft‑matter systems across a wide q‑range. Its versatile configuration allows measurements on powders, pastes, gels, liquids, and films through a comprehensive set of sample holders that support both standard and customized environments. The system integrates precise temperature‑control modules for studies under variable thermal conditions, facilitating the analysis of phase transitions, self‑assembly processes, and thermally activated structural rearrangements. A robotic unit automates sample loading and preparation, ensuring high throughput, reproducibility, and efficient workflow management for large experimental series. The collimation and beam‑conditioning optics provide a highly focused and stable X‑ray beam, enabling measurements with excellent signal‑to‑noise ratio, while the GISAXS geometry allows detailed investigation of surface‑supported nanostructures, thin‑film morphology, and in‑plane ordering. The system’s advanced detection capabilities support rapid data acquisition and time‑resolved experiments, making it suitable for kinetic studies and in‑situ monitoring of structural evolution. Overall, the XEUSS 3.0 platform offers a powerful and flexible solution for researchers and industrial users requiring quantitative nanoscale characterization across diverse material classes.

Experimental team

Instrument Scientist
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