AFM

General Information

Technique

Microscopy

Key Instrumentation

AFM Nanowizard 4XP - JPK-Bruker

The Nanowizard® 4XP – JPK-Bruker Atomic Force Microscope integrates high spatial resolution, force sensitivity, and rapid scanning performance in a single, versatile platform. With scan rates of up to 150 lines/sec and a large 100 µm scan range, this AFM system enables high-resolution topographical imaging together with precise quantitative mechanical measurements across a wide variety of sample types. It is specifically engineered to provide exceptional mechanical and thermal stability when mounted on inverted optical microscopes, ensuring reliable performance during long-term experiments. This makes it suitable for investigations ranging from single molecules and macromolecular assemblies to living cells and tissue samples under physiologically relevant conditions. The system supports structural analysis, nanomechanical characterization, and biophysical investigations of complex biological systems, allowing researchers to probe fundamental molecular mechanisms, biochemical interactions, and cellular mechanics at the nanoscale. Its flexibility and performance make it ideal for applications in cell biology, biophysics, biomaterials science, and mechanobiology. In addition, it is equipped with the JPK CellMech Package, specifically developed for advanced microrheology measurements, enabling quantitative assessment of viscoelastic properties, force-dependent behaviors, and intracellular mechanical responses of biological samples under controlled experimental conditions. Data analysis is supported by the JPK DP software, which facilitates efficient visualization, processing, and quantitative interpretation of AFM imaging, force spectroscopy, and microrheology data.

Experimental team

Instrument Scientist
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