AFM PARK
General Information
NX10 is built around improved XY and Z separated scanner performance. This includes fast Z-servo speed, which gives quick vertical response, and improved Z scan straightness for accurate imaging. In addition, the XY scanner ensures precise positioning during scans.
Another highlight is the low Z detector noise. Thanks to the stacked piezo actuator and strain gauge sensor, the NX provides both high precision and low noise levels from extremely flat to rough samples. The NX head integrates a superluminescent diode that provides low coherence illumination, minimizing interference for stable signal detection. The laser beam is guided through precision mirrors to the cantilever and position-sensitive photodetector (PSPD), ensuring accurate signal alignment.
Tecnical description
max sample size: 100×100 mm, 20mm thickness, scan range XY: 50×50 µm, Z: 15 µm. Conductive AFM electrical gain range with VECA amplifier (10pA – 10mA).
Research areas and applications
materials science, nanotechnology, mechanical and electrical properties, magnetic behavior.
Science highlights
Experimental team
- Stefano Boldrini
- CNR - ICMATE
- Alessia Famengo
- CNR - ICMATE
- Alberto Ferrario
- CNR - ICMATE