FE-SEM CNR IPCB

General Information

Key instrumentation

Electron Microscope / Scanning Probe Microscope / X-Ray microanalysis

Scanning electron microscopy with Energy Dispersive X-ray analysis

Tecnical description
Scanning Electron Microscope with field emission source, equipped with SE, BSE and Environmental (GSED) detectors, EDS system (Oxford Inca Energy System 250), heating stage (FEI) and tensile/compression test module (Gatan MST200).
Research areas and applications

Thanks to its versatility and its accessories, the SEM FEI is very useful for the characterization in high vacuum, low vacuum and extended low vacuum (ESEM) conditions of inorganic, organic and biological materials through morphological analysis using different detectors and elemental analysis and mapping. The accessory for in-SEM mechanical analysis of samples is also available.
Science highlights

Instrument Scientist