FIB-SEM GAIA 3
General information
Category
The configuration Dual Beam in systems is such that the electron and ion beam (Gallium) focal points coincide, which results in the optimization of many applications. Such a feature enables simultaneous SEM imaging during FIB milling tasks – a significant leap in terms of performance and throughput in all those FIB operations that demand ultimate levels of precision.
Technical description
Research areas and applications
Tescan Gaia 3 is use a versatile instrument for analysis (EDS) and characterization (SEM-STEM) using electron microscopy techniques on samples of various kinds: materials, metallurgy, coatings, renewable energy, life sciences, cultural heritage, agri-food. Metrological investigations. Micro & Nano processing of surfaces by ion beam (FIB).