AFM Raman with SNOM

General Information

Technique

Microscopy

Key Instrumentation

AFM Raman, Spectroscopy QuantumDesign - SNOM

The WITec alpha300 microscope is a versatile and user-friendly platform that integrates Scanning Near-field Optical Microscopy (SNOM), confocal microscopy, and Atomic Force Microscopy (AFM) within a single system. This unique combination enables comprehensive nanoscale characterization by correlating optical, chemical, and topographical information. Users can seamlessly switch between measurement modes through a simple rotation of the objective turret, ensuring flexibility and ease of operation.
The alpha300 series supports multiple beam path geometries, allowing adaptation to a wide range of excitation and detection schemes. Its modular design accommodates both inverted and upright microscope configurations. The inverted setup is particularly suited for transparent samples, such as those commonly encountered in life sciences, while the upright configuration and side-illumination options provide optimal performance for opaque materials.
By integrating complementary techniques into one platform, the system enables efficient workflows and precise co-localization of data acquired from the same sample region. This capability is especially valuable for applications requiring correlated structural, chemical, and optical analysis at the micro- and nanoscale.
As a result, the WITec alpha300 platform delivers optimized performance across a broad spectrum of research fields, including life sciences, pharmaceutics, materials science, carbon-based materials, photovoltaics and semiconductors, nanophotonics, and low-dimensional materials. Its flexibility and advanced capabilities make it a powerful tool for both fundamental research and applied investigations.

Experimental team

Instrument Scientist