SEM FEI
General Information
Thanks to its versatility and accessories, the SEM FEI is very useful for the characterization in high vacuum, low vacuum, and extended low vacuum (ESEM) conditions of inorganic, organic, and biological materials through morphological analysis using different detectors and elemental analysis and mapping. The accessory for in-SEM mechanical analysis of samples is also available.
Tecnical description
Field Emission Scanning electron microscopy QUANTA 200 equipped with:
– Peltier Stage
– Peltier heating Stage Control Kit (1000°C)
– Energy Dispersive X-Ray Spectrometer (EDS) Oxford Inca Energy System 250 equipped
with INCAx-act LN2-free Analytical Silicon Drift Detector with PentaFET® Precision
Detectors:
– Secondary electron detector (SED) Everhardt-Thornley
– Large field detector (LFD)
– Gaseous SED (GSED)
– Backscattered electron detectors (BSED) for HV and observations
– Solid state STEM detectorResearch areas and applications
Thanks to its versatility and its accessories, the SEM FEI is very useful for the characterization in high vacuum, low vacuum and extended low vacuum (ESEM) conditions of inorganic, organic and biological materials through morphological analysis using different detectors and elemental analysis and mapping. The accessory for in-SEM mechanical analysis of samples is also available.
Science highlights
Experimental team
- Gennaro Gentile
- CNR-IPCB
- Researcher