SEM LEO SUPRA
General Information
Category
The SUPRA 35 Field Emission SEM provides improved image resolution and high productivity andversatility. It is an analytical instrument widely used for imaging and analyzing various sample types. It offers a magnification range of up to 500,000-fold. It is also equipped with pressure and pumping equipment, an SE detector, and an image capture system. It allows to analyse and interpret the sample in its natural state quickly and helps to image and analyze micro-particles It is ideal for applications in industrial, academic, and research settings and allows for fast and accurate imaging and analysis of samples.
Tecnical description
The FE-SEM electron gun is a Schottky Field Emission Gun, and it is endowed with several detectors: a Back Scattering Detector, Everhart Thornley, an In-lens Secondary Electron Detector, and an Energy Dispersive Spectrometer (EDS) from Oxford Instruments INCA 200 for the measurement of secondary X-rays induced by primary electrons and allowing elemental analysis. The ability to detect BSE leads to the obtaining of sub-surface information and nano-scale composition. The instrument features a Field Emission Scanning Electron Microscope (FE-SEM), a Gemini column, and a motorized stage.
Research areas and applications
Materials characterization: solid-state or biological specimens, conductive and non-conductive.
Science highlights
Experimental team
- Giovanni Romanelli
- NAST Centre - University of Rome Tor Vergata
- Researcher
- Anna Prioriello
- NAST Centre - University of Rome Tor Vergata
- PostDoc