by Chiara Cilona | Oct 4, 2022
Scanning electron microscope with field-emission source, equipped with detectoirs for EDS, backscattered and secondary electrons
by Chiara Cilona | Oct 4, 2022
Nicolet Nexus 870. Instrument for FT-IR spectroscopy and microscopy, model Nicolet Nexus 870, equipped with external optical table, two external detectors (MCT e TRS), GeATR, one Hind photoelastic modulator, and one IR Continuµm microscope.
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