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About
Vision and mission
Governing Bodies
Pools of Expertise
Training and Outreach
For users
For Industry
Instrumentation
Careers
Contact
Archives:
Instruments
TEM FEI
02/09/2021
Transmission Electron Microscope with LaB6 source (120 kV) and BF detector and FEI Eagle 4k CCD camera (bottom mounted).
SEM-AFM with Optical Profiler
02/09/2021
SEM system with EDS-SPM, Correlative AFM during SEM. The instrument has conventional tungsten filament, equipped with modern electron optics based…
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