SEM ZEISS SIGMA

SEM ZEISS SIGMA

Scanning electron microscope with field-emission source, equipped with detectoirs for EDS, backscattered and secondary electrons
FT-IR Nexus

FT-IR Nexus

Nicolet Nexus 870. Instrument for FT-IR spectroscopy and microscopy, model Nicolet Nexus 870, equipped with external optical table, two external detectors (MCT e TRS), GeATR, one Hind photoelastic modulator, and one IR Continuµm microscope.
Cryogenic Electron Microscopy

Cryogenic Electron Microscopy

Cryogenic Electron Microscopy in Transmission, model Thermo Scientific™ Glacios™. The instrument is equipped with XFEG optics at 200 keV, cryogenic system of the sample preparation and handling, and software and support tools for the analysis of collected...
Raman Confocal Microscope

Raman Confocal Microscope

Microscope inViaTM QontorTM model, with excitations at 532 and 785 nm, with motorized XYZ stage, flexible arm and Raman imaging techniquesx