04/10/2022Scanning electron microscope with field-emission source, equipped with detectoirs for EDS, backscattered and secondary electrons
04/10/2022Nicolet Nexus 870. Instrument for FT-IR spectroscopy and microscopy, model Nicolet Nexus 870, equipped with external optical table, two external…- 04/10/2022Microscope inViaTM QontorTM model, with excitations at 532 and 785 nm, with motorized XYZ stage, flexible arm and Raman imaging…
28/09/2022Laser Scanning Confocal Microscope Leica TCS SP2 equipped with 3 fluorescence PMT detectors
10/01/2022Based on thermogravimetric analysis combined with FTIR: TGA Perkin Elmer Pyris 1 coupled to a Perkin Elmer Spectrum™ Frontier FTIR…
02/09/2021SEM system with EDS-SPM, Correlative AFM during SEM. The instrument has conventional tungsten filament, equipped with modern electron optics based…
