Medium Range Facilities

The Transmission Electron Microscope JEM 2100 Plus with EDS features a LaB emitter and operates between 80 kV and 200 kV, providing a point to point resolution of 0,24 nanometers. The TEM JEOL is equipped with an EDS system for microanalysis and a 9 Mpx CMOS camera, enabling high quality structural and compositional characterization across a wide range of materials, and it can operate in STEM mode.

TESCAN UniTOM HR is a micro-CT system enabling multi-scale X-Ray Imaging with spatial resolution ranging from 10 µm to around 600 nm, supports continuous 360° rotation, in situ experiments. This instrument is designed for dynamic studies and it accommodates large and heavy samples. Its applications can extend to archaeology and cultural heritage.

The LEICA DMi8 inverted bright field microscope (with the dimensions of 375 mm x 330 mm x 27 mm) enables time lapse imaging of cells and tissues in lab on chip and organ on chip devices, using an integrated incubator. The Time Lapse Microscopy platform high precision XYZ motorized stage allows acquisition of multiple regions, in order to monitor different experimental conditions over time.

The Ultrafast Transmission Electron Microscope at LUMiNaD is the first facility in Italy to couple a femtosecond laser with a transmission electron microscope, achieving simultaneous femtosecond temporal and sub nanometer spatial resolution. The cross scale approach of this instrument enables the investigation of ultrafast phenomena, such as the ultrafast dynamics of low-dimensional materials.

The Rigaku SmartLab SE is an X ray powder diffractometer for crystalline powders and thin films, featuring automatic alignment and a chamber for non-ambient experiments. This instrument enables powder diffraction under inert atmospheres up to 1 bar or under vacuum, with temperature control from 220 K to 500 K for in situ structural studies.

The RIGAKU Nano3DX is an X-ray microscope to measure large samples at high resolution. This is achieved with a high-power rotating anode X-ray source and a high-resolution complementary metal oxide semiconductor type detector. The instrument allows CT reconstruction, image processing, 3D quantitative analysis and it is characterized by a temperature control system and mechanical compression of sample.