The Transmission Electron Microscope JEM 2100 Plus with EDS (Energy-Dispersive X-ray Spectroscopy) features a LaB emitter and operates between 80 kV and 200 kV, providing a point to point resolution of 0,24 nanometers. The TEM JEOL is equipped with an EDS system for micro analysis and a 9 Mpx CMOS camera, enabling high quality structural and compositional characterization across a wide range of materials, and it can operate in STEM (Scanning Transmission Electron Microscopy) mode