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Technique:
Microscopy
HR Evolution – Horiba
10/01/2022
The spectrometer has a focal length of 800 mm, two grids (1800 and 600 grooves / µm), and a CCD…
SEM FEI
10/01/2022
Scanning Electron Microscope with field emission source, equipped with SE, BSE and Environmental (GSED) detectors, EDS system (Oxford Inca Energy…
Zeiss Gemini 500
09/01/2022
Accelerating voltage between 1 kV to 30 kV, nominal resolution of 1.2 nm. In addition to the common “in-camera” BSE…
TEM FEI
02/09/2021
Transmission Electron Microscope with LaB6 source (120 kV) and BF detector and FEI Eagle 4k CCD camera (bottom mounted).
SEM-AFM with Optical Profiler
02/09/2021
SEM system with EDS-SPM, Correlative AFM during SEM. The instrument has conventional tungsten filament, equipped with modern electron optics based…
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