23/05/2023DMA Star Systems – Mettler Toledo – allows Dynamic mechanical analysis to measure the mechanical and viscoelastic properties of materials…- 04/10/2022FIB-SEM with simultaneous milling and EBSD. The intrument allows preparation of high-quality ultra-thin TEM lamellae, delayering processes in technology nodes,…
- 04/10/2022Scanning electron microscope with field-emission source, equipped with detectoirs for EDS, backscattered and secondary electrons
- 04/10/2022Xenocs XEUSS 3.0 system operates in SAXS (Small Angle X-ray Scattering), USAXS (Ultra SAXS) and GISAXS (Grazing Incidence SAXS) modes.…
04/10/2022Nicolet Nexus 870. Instrument for FT-IR spectroscopy and microscopy, model Nicolet Nexus 870, equipped with external optical table, two external…- 04/10/2022Cryogenic Electron Microscopy in Transmission, model Thermo Scientific™ Glacios™. The instrument is equipped with XFEG optics at 200 keV, cryogenic…
- 04/10/2022Microscope inViaTM QontorTM model, with excitations at 532 and 785 nm, with motorized XYZ stage, flexible arm and Raman imaging…
26/09/2022
26/09/2022Small and Wide Angle X-ray Diffractometer. Samples can be measured at different temperature, humidity, high pressure and under mechanical stress/strain…
26/09/2022
