Medium Range Facilities

The Xenocs XEUSS 3.0 system supports SAXS (Small Angle X-ray Scattering), USAXS (Ultra Small Angle X-ray Scattering) and GISAXS (Grazing Incidence Small Angle X-ray Scattering) modes, and it is used for structural analysis across multiple length scales. It includes sample holders for powders, pastes, gels, liquids and films, along with temperature control and robotic unit for automated sample handling, ensuring reproducible experiments. The scattering wavevector range is between 0.0002 and 3.1 Å-1

The SAXS/WAXD (Small Angle X-ray Scattering / Wide Angle X-Ray Scattering) facility supports structural characterization of inorganic and organic materials, enabling analysis of crystal structures, phase domains, phase segregation, and the organization and orientation of nanomaterials. This Small Angle X-ray Scattering / Wide Angle X-Ray Scattering provides complementary scattering information across multiple length scales for comprehensive material studies

The SEM (Scanning Electron Microscope) FEI (Field Emission Instrumentation) offers versatile characterization of inorganic, organic and biological materials in high vacuum, low vacuum and ESEM (Exploratory Structural Equation Modeling) modes. This instrument supports detailed morphological analysis with multiple detectors, along with elemental analysis and mapping. An additional module enables Scanning Electron Microscopy mechanical testing of samples is also available

The Scanning Electron Microscope Zeiss Gemini 500 with a Fielld Emission Gun (FEG-SEM) offers a nominal resolution and it is equipped with an integrated EDS (Energy Dispersive) / WDS (Wave Dispersive) with high spatial precision. micro analytical system for elemental characterization. This instrument also includes an EBSD (Electron backscatter diffraction) detector, enabling crystallographic analysis of sample surfaces with high spatial precision

The ZEISS SIGMA Scanning Electron Microscope SEM is a field emission scanning electron microscope. This instrument is equipped with detectors for secondary and backscattered electrons, as well as an EDS (mean Energy-Dispersive X-ray Spectroscopy) system for elemental analysis. The configuration of this microscope enables high resolution morphological and compositional characterization across a wide range of materials, on both conducting and non-conducting samples

The Scanning Electron Microscope SEM system features a tungsten filament source and a four lens WFO column, integrating EDS (Energy-Dispersive X-ray Spectroscopy) and a localized AFM (Atomic Force Microscopy) for correlative analysis. The vacuum chamber of this isntrument accommodates oversized samples and hosts additional tools, including an optical profiler, nanomanipulation facilities and a micro dynamometer. A STM module will also be available, expanding its characterization capabilities

The SOURIRE Lab is a 14 MeV fast neutron irradiation facility for material testing, neutron activation analysis and detector calibration. The Deuterium–Tritium neutron source delivers a flux of 10^10 neutron per second over the full solid angle, enabling radiation hardness studies and characterization of fast neutron detectors for applications such as nuclear fusion. The expected start date of activities is June 2026: now it is possible to conduct irradiation measurements for radiation hardness testing and neutron activation analysis

The Varian Eclipse spectrometer is a fluorimeter designed for measuring excitation and emission spectra of fluorophores in solution. The excitaiton lamp is a Xenon flash lamp (80 Hz) with excitation and emission range from 200 nm to 900 nm. The system is equipped with a temperature control that allows to perform programmable temperature ramps. It provides sensitive, high quality fluorescence analysis, supporting a wide range of studies on molecular environments, interactions and photophysical properties

The Transmission Electron Microscope FEI (Field Emission Instrumentation) Tecnai G2 Spirit TWIN with LaB6 source enables morphological and structural characterization of inorganic, organic and biological materials in bright field mode. A cryo-ultramicrotomy setup (LEICA EM UC6/FC6 cyo-ultramicrotome) is available for preparing ultrathin sections for Transmission Electron Microscope observations, ensuring high quality sample preparation for detailed TEM analysis

The instrument is a FEG analytical S/TEM (Transmission Electron Microscope) that delivers high resolution Transmission Electron Microscopy, STEM (High-Resolution Transmission Electron Microscopy and High-Resolution Scanning Transmission Electron Microscopy) imaging, combined with industry leading EDS detection. This instrument enables EDS analysis and navigation for dynamic microscopy, supporting advanced structural and compositional characterization at the nanoscale