Medium Range Facilities

Instruments found: 45
Created with GIMP

SAXS WAXD

Small and Wide Angle X-ray Diffractometer. Samples can be measured at different temperature, humidity, high pressure and under mechanical stress/strain conditions. Special features: – TrueFocus: self-alignment with X-ray beam; TrueSWAXS: simultaneous SWAXS up to 60° 2Ѳ.

SEM FEI

Scanning Electron Microscope with field emission source, equipped with SE, BSE and Environmental (GSED) detectors, EDS system (Oxford Inca Energy System 250), heating stage (FEI) and tensile/compression test module (Gatan MST200).

SEM ZEISS GEMINI

FEG-SEM with a nominal resolution of 1.2 nm, equipped with an integrated EDS/WDS micro-analytical system and with an EBSD detector for the crystallographic analysis of the sample surface

SEM ZEISS SIGMA

Scanning electron microscope with field-emission source, equipped with detectoirs for EDS, backscattered and secondary electrons

SEM-AFM with Optical Profiler

SEM system with EDS-SPM, Correlative AFM during SEM. The instrument has conventional tungsten filament, equipped with modern electron optics based on a unique four-lens Wide Field OpticsTM column. The SEM is equipped with four types of detectors (EDS, BSE, SE).

SOURIRE

The SOURIRE Lab is a fast (14 MeV) neutron irradiation plant for material testing, neutron activation analysis and calibration of new detectors. The neutron source is a Deuterium-Tritium (D-T) type, and the total flux is 10 10 neutron per second over the entire solid angle.

Spectrofluorimeter

The spectrometer Eclipse, Varian, is a fluorimeter for the measurement of excitation and emission spectra of fluorophores in solutions.

TEM FEI

Transmission Electron Microscope with LaB6 source (120 kV) and BF detector and FEI Eagle 4k CCD camera (bottom mounted).

TEM High Resolution

The TEM instrument – ThermoFisher Talos F200X – combines outstanding high-resolution S/TEM and TEM imaging with high performance energy dispersive x-ray spectroscopy (EDS) signal detection and 3D chemical characterization with compositional mapping.

TEM JEOL

Transmission Electron Microscope (TEM) with LaB6 emitter, 80-200 kV accelerating voltage, point-to-point resolution of 0.24 nm, EDS micro-analysis, 9 Mpx CMOS camera.

Instruments found: 45

QSM – Quantum Scanning Microscope

The QSM is a scanning magnetometer with nominal spatial resolution of 10 nm and magnetic sensitivity better than 1uT/sqrt(Hz). It incorporates a commercial AFM system to allow correlative magnetic measurements at the nanometer scale.

Raman Confocal Microscope

Microscope inViaTM QontorTM model, with excitations at 532 and 785 nm, with motorized XYZ stage, flexible arm and Raman imaging techniquesx

RETINA

RETINA provides non-destructive material analysis of various medium-sized samples via X-ray Fluorescence (XRF) spectroscopy, and 2D/3D X-ray imaging techniques.

SAXS GISAXS

Xenocs XEUSS 3.0 system operates in SAXS (Small Angle X-ray Scattering), USAXS (Ultra SAXS) and GISAXS (Grazing Incidence SAXS) modes. It is equipped for measurements on powders, pastes, gels, liquids and films, temperature control and robot for automation of samples.
Created with GIMP

SAXS WAXD

Small and Wide Angle X-ray Diffractometer. Samples can be measured at different temperature, humidity, high pressure and under mechanical stress/strain conditions. Special features: - TrueFocus: self-alignment with X-ray beam; TrueSWAXS: simultaneous SWAXS up to 60° 2Ѳ.

SEM FEI

Scanning Electron Microscope with field emission source, equipped with SE, BSE and Environmental (GSED) detectors, EDS system (Oxford Inca Energy System 250), heating stage (FEI) and tensile/compression test module (Gatan MST200).

SEM ZEISS GEMINI

FEG-SEM with a nominal resolution of 1.2 nm, equipped with an integrated EDS/WDS micro-analytical system and with an EBSD detector for the crystallographic analysis of the sample surface

SEM ZEISS SIGMA

Scanning electron microscope with field-emission source, equipped with detectoirs for EDS, backscattered and secondary electrons

SEM-AFM with Optical Profiler

SEM system with EDS-SPM, Correlative AFM during SEM. The instrument has conventional tungsten filament, equipped with modern electron optics based on a unique four-lens Wide Field OpticsTM column. The SEM is equipped with four types of detectors (EDS, BSE, SE).

SOURIRE

The SOURIRE Lab is a fast (14 MeV) neutron irradiation plant for material testing, neutron activation analysis and calibration of new detectors. The neutron source is a Deuterium-Tritium (D-T) type, and the total flux is 10 10 neutron per second over the entire solid angle.